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MAX9957CCB
Fast Dual Driver for ATE with Waveform Shaping

DDR2 Memory Testers, GDDR3, and GDDR4 for ATE Applications Requiring 2Gbps Performance and Waveform Fidelity Control


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Description
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The MAX9957 dual driver IC for automatic test equipment (ATE) memory applications offers three-level drive capability, high-speed switching, low timing dispersion, and features voltage-controlled waveform shaping to enhance edge-placement accuracy and minimize distortion. It also provides tight matching of gain and offset. The MAX9957 buffers reference voltage inputs for each channel with nominal -1V to +3.5V voltage ranges. High-speed differential control inputs, compatible with CML levels, are provided for each channel. Static power dissipation is only 1500mW per channel with nominal -5V and +7V supplies. Power dissipation at 2Gbps toggling is only 1550mW/channel.

The MAX9957 is available in a 10mm x 10mm x 1mm, 64-pin TQFP package with an exposed pad, inverted die pad for ease of heat removal.

Key Features   Applications/Uses
  • Terminator/3-Level Driver
  • 2Gbps Toggling at 2VP-P
  • 1550mW/Channel at 2Gbps Toggling
  • Voltage-Controlled Waveform Shaping
  • Interfaces Easily with Most Logic Families
  • Low Timing Dispersion

 
  • Automatic Test Equipment: DDR2 Memory Testers, GDDR3, GDDR4

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    Document Ref.: 19-0861; Rev 0; 2007-08-17
    This page last modified: 2007-08-17



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